Multi-cycle Test with Partial Observation on Scan-Based BIST Structure

@article{Sato2011MulticycleTW,
  title={Multi-cycle Test with Partial Observation on Scan-Based BIST Structure},
  author={Yasuo Sato and Hisato Yamaguchi and Makoto Matsuzono and Seiji Kajihara},
  journal={2011 Asian Test Symposium},
  year={2011},
  pages={54-59}
}
Field test for reliability is usually performed with small amount of memory resource, and it requires a new technique which might be somewhat different from the conventional manufacturing tests. This paper proposes a novel technique that improves fault coverage or reduces the number of test vectors that is needed for achieving the given fault coverage on scan-based BIST structure. We evaluate a multi-cycle test method that observes the values of partial flip-flops on a chip during capture-mode… CONTINUE READING

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References

Publications referenced by this paper.
SHOWING 1-10 OF 19 REFERENCES

On test pattern compaction with multi-cycle and multi-observation scan test

  • 2010 10th International Symposium on Communications and Information Technologies
  • 2010
VIEW 5 EXCERPTS

Circuit Failure Prediction by Field Test (DART) with Delay- Shift Measurement Mechanism

Y. Sato, S. Kajihara, +4 authors Y. Miura
  • Integrated Circuits and Devices in Vietnam, pp. 5-10, Aug. 2010.
  • 2010
VIEW 2 EXCERPTS

A circuit failure prediction mechanism (DART) for high field reliability

  • 2009 IEEE 8th International Conference on ASIC
  • 2009
VIEW 1 EXCERPT

A self-adaptive system architecture to address transistor aging

  • 2009 Design, Automation & Test in Europe Conference & Exhibition
  • 2009
VIEW 1 EXCERPT

We Have Got Compression, What Next?

  • European Test Symposium
  • 2009
VIEW 1 EXCERPT

Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

  • IEEE Transactions on Device and Materials Reliability
  • 2007
VIEW 2 EXCERPTS