Multi-Vector Tests: A Path to Perfect Error-Rate Testing

  title={Multi-Vector Tests: A Path to Perfect Error-Rate Testing},
  author={Shideh Shahidi and Sandeep Gupta},
  journal={2008 Design, Automation and Test in Europe},
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the value at a circuit's output deviates from the corresponding error-free value, has been identified as a key metric for severity. In error-rate testing every chip that has an error rate greater than or equal to a threshold specified by the application is unacceptable for the application and discarded; all other chips are… CONTINUE READING