Multi-Objective Genetic Algorithm for FPGA Testing

  title={Multi-Objective Genetic Algorithm for FPGA Testing},
  author={Vinay Chopra and Davinder Singh},
This paper gives a concise introduction to Multi-Objective Genetic Algorithms and FPGAs and it reveals that how Automatic Test Pattern Generation method can be formulated in terms of CNF form which in turn used to generate test patterns using Multi-Objective Genetic Algorithm. By applying a Multi-Objective Genetic Algorithm on this CNF form, it has been observed from the experiments that as the problem size are increased by increasing number of variables and clauses, the fault coverage ratio… CONTINUE READING


Publications referenced by this paper.
Showing 1-10 of 24 references

SAT-Based Techniques in Test Vectors Chopra and Singh 5 Generation

Fadi A. Aloul, Assim Sagahyroon
International Journal of Advances in Information Technology, • 2010

SATbased Automatic Test Pattern Generation

Rolf Drechsler, Stephan Eggersglub, Gorschwin Fey, Daniel Tille
Dagstuhl Seminar Proceedings 08351, Evolutionary test Generation • 2009

Efficiency of Multi-Valued Encoding in SAT-based ATPG

36th International Symposium on Multiple-Valued Logic (ISMVL'06) • 2006

Field Programmable Gate Array Logic Synthesis using Boolean Satisfiability

C. L. Andrew
M. Tech. Thesis submitted to Graduate Department of Electrical and Computer Engineering Department, • 2005

PASSAT: efficient SAT-based test pattern generation for industrial circuits

IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) • 2005

Walash (Eds.) “Theory and Applications of Satisfiability Testing

Fahiem Bacchus, Toby
8th Springer International Conference, SAT June 19- • 2005

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