Multi-Mechanism Reliability Modeling and Management in Dynamic Systems

  title={Multi-Mechanism Reliability Modeling and Management in Dynamic Systems},
  author={Eric Karl and David Blaauw and Dennis Sylvester and Trevor N. Mudge},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
Reliability failure mechanisms, such as time-dependent dielectric breakdown (TDDB), electromigration, and negative bias temperature instability (NBTI), have become a key concern in integrated circuit (IC) design. The traditional approach to reliability qualification assumes that the system will operate at maximum performance continuously under worst case voltage and temperature conditions. In reality, due to widely varying environmental conditions and an increased use of dynamic control… CONTINUE READING
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Transient effects and characterization methodology of negative bias temperature instability in PMOS transistors

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  • Proc. 41st Int. Reliab. Phys. Symp., Apr. 2003…
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