Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces

@article{Alvarado2019MonteCR,
  title={Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces},
  author={Andrew Alvarado and Hsing-Yin Chang and Warren Nadvornick and Nasr Ghoniem and Jaime Marian},
  journal={Applied Surface Science},
  year={2019}
}
Abstract Secondary electron emission (SEE) from inner linings of plasma chambers in electric thrusters for space propulsion can have a disruptive effect on device performance and efficiency. SEE is typically calculated using elastic and inelastic electron scattering theory by way of Monte Carlo simulations of independent electron trajectories. However, in practice the method can only be applied for ideally smooth surfaces and thin films, not representative of real material surfaces. Recently… Expand

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