Modular compactor of test responses

@article{Rajski2006ModularCO,
  title={Modular compactor of test responses},
  author={Wojciech Rajski and Janusz Rajski},
  journal={24th IEEE VLSI Test Symposium},
  year={2006},
  pages={10 pp.-251}
}
This paper describes a new time compactor built of multiple-input circular registers of relatively prime length. It has excellent ability to detect errors corresponding to real defects such as errors of small multiplicity and burst errors. It operates in modular arithmetic and uses the Chinese remaindering to diagnose scan errors. Given that circular registers do not multiply errors or X values, the compactor is X tolerant. 
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