Modification of amorphous level 15 AIM SPICE model to include new subthreshold model


Recently we presented a new expression to model mobility in a-Si:H TFTs model parameters in the subthreshold region and the procedure for the extraction of basic model parameters in this region. The main characteristics of extraction procedure is the use of the Integral Function Method (IFM), that permits to extract in a simple and direct way basic model… (More)


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