Modelling of high dynamic range logarithmic CMOS image sensors

  title={Modelling of high dynamic range logarithmic CMOS image sensors},
  author={S. Otim and D. Joseph and B. Choubey and S. Collins},
  journal={Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)},
  pages={451-456 Vol.1}
  • S. Otim, D. Joseph, +1 author S. Collins
  • Published 2004
  • Computer Science
  • Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)
The quality of the output images from high dynamic range logarithmic sensors is limited by fixed pattern noise (FPN) which is caused by device mismatches within pixels in an array. It leads to inferior image quality in comparison to image from other sensors of similar resolution. Previous design and post-chip attempts to correct this type of noise have been either impractical or resulted in other complexities. However, FPN correction can be attempted using an accurate model approach for the… Expand
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