Modeling the evolution of conducted EMI of a buck converter after N-MOS transistor aging

Abstract

In this paper, we propose a method to model the Conducted ElectroMagnetic Interference variation (ACEMI) generated by a DC / DC converter based on a MOSFET according to an accelerated aging time. A relation between the ACEMI and the threshold voltage variation (AVtn) is determined by simulation, using a SPICE MOSFET model. Through the literature researches… (More)

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