Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors

  title={Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors},
  author={Eric R. Fossum},
  journal={IEEE Journal of the Electron Devices Society},
  • E. Fossum
  • Published 30 September 2013
  • Physics
  • IEEE Journal of the Electron Devices Society
Imaging performance metrics of single-bit and multi-bit photo-electron-counting quanta image sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. The D-log H characteristic of single-bit sensors including overexposure latitude is quantified. Linearity and dynamic range are also investigated. Read-noise-induced bit-error rate is analyzed and a read-noise target of less than 0.15 e-rms is suggested. 

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