Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET

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@article{Michez2013ModelingDE, title={Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET}, author={A. Michez and Jerome Boch and S. Dhombres and Fr{\'e}d{\'e}ric Saign{\'e} and Antoine D. Touboul and J.-R. Vaill{\'e} and Laurent Dusseau and E. Lorf{\`e}vre and R. Ecoffet}, journal={Microelectronics Reliability}, year={2013}, volume={53}, pages={1306-1310} }