Modeling and testing of interference faults in the nano NAND Flash memory

@article{Zha2012ModelingAT,
  title={Modeling and testing of interference faults in the nano NAND Flash memory},
  author={Jin Zha and Xiaole Cui and Chung-Len Lee},
  journal={2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
  year={2012},
  pages={527-531}
}
Advance of the fabrication technology has enhanced the size and density for the NAND Flash memory but also brought new types of defects which need to be tested for the quality consideration. This work analyzes three types of physical defects for the deep nano-meter NAND Flash memory based on the circuit level simulation and proposes new categories of… CONTINUE READING