Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells

@article{Hu2009ModelingAT,
  title={Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells},
  author={Yong-Jyun Hu and Yu-Jen Huang and Jin-Fu Li},
  journal={2009 27th IEEE VLSI Test Symposium},
  year={2009},
  pages={15-20}
}
Ternary content addressable memory (TCAM) is a key component in various applications for its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. A march-like test algorithm is also proposed to cover the defined comparison faults. The… CONTINUE READING