Modeling and Forecasting of Manufacturing Variations

@inproceedings{NassifModelingAF,
  title={Modeling and Forecasting of Manufacturing Variations},
  author={Sani R. Nassif}
}
Process-induced variations are an important consideration in the design of integrated circuits. Until recently, it was sufficient to model die-to-die shifts in device performance, leading to the well known worst-case modeling and design methodology [1, 2]. However, current and near-future integrated circuits are large enough that device and interconnect parameter variations within the chip are as important as those same variations from chip to chip. This presents a new set of challenges for… CONTINUE READING
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