Modeling Power Supply Noise in Delay Testing

  title={Modeling Power Supply Noise in Delay Testing},
  author={Jing Wang and D. M. H. Walker and Xiang Lu and Ananta K. Majhi and Bram Kruseman and Guido Gronthoud and Luis Elvira Villagra and Paul van de Wiel and Stefan Eichenberger},
  journal={IEEE Design & Test of Computers},
Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them much faster than existing power noise analysis tools. can cause performance degradation and 
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Power Supply Noise in Delay Testing

2006 IEEE International Test Conference • 2006

A Case Study of IR-Drop in Structured At-Speed Testing,’

J. Saxena
Proc. Int’l Test Conf. (ITC 03), IEEE CS Press, • 2003

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