Modeling Erratic Bits Temperature Dependence for Monte Carlo Simulation of Flash Arrays

  title={Modeling Erratic Bits Temperature Dependence for Monte Carlo Simulation of Flash Arrays},
  author={Cristian Zambelli and Gert Koebernik and Rudolf Ullmann and Matthias Bauer and Georg Tempel and Piero Olivo},
  journal={IEEE Electron Device Letters},
The erratic bits phenomenon has been extensively characterized in the last decade due to its massive burden on the performance and reliability of Flash memory devices. From a statistical standpoint, it has been possible to describe a Markov-chain-based model of this phenomenon in large arrays suitable for Monte Carlo simulation. This model, however, is based on the assumption of complete independence of the probabilistic parameters characterizing each erratic bit from the testing temperature… CONTINUE READING
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