Modeling, verification and pattern generation for reconfigurable scan networks

@article{Baranowski2012ModelingVA,
  title={Modeling, verification and pattern generation for reconfigurable scan networks},
  author={Rafal Baranowski and Michael Andreas Kochte and Hans-Joachim Wunderlich},
  journal={2012 IEEE International Test Conference},
  year={2012},
  pages={1-9}
}
Reconfigurable scan architectures allow flexible integration and efficient access to infrastructure in SoCs, e.g. for test, diagnosis, repair or debug. Such scan networks are often hierarchical and have complex structural and functional dependencies. For instance, the IEEE P1687 proposal, known as IJTAG, allows integration of multiplexed scan networks with arbitrary internal control signals. Common approaches for scan verification based on static structural analysis and functional simulation… CONTINUE READING
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