Modeling, Fabrication, and Characterization of Large Carbon Nanotube Interconnects With Negative Temperature Coefficient of the Resistance

@article{Maffucci2017ModelingFA,
  title={Modeling, Fabrication, and Characterization of Large Carbon Nanotube Interconnects With Negative Temperature Coefficient of the Resistance},
  author={Antonio Maffucci and Federico Micciulla and Antonino Cataldo and G. Miano and Stefano Bellucci},
  journal={IEEE Transactions on Components, Packaging and Manufacturing Technology},
  year={2017},
  volume={7},
  pages={485-493}
}
One of the most appealing properties of carbon nanotube (CNT) interconnects is the possibility of exhibiting, under certain circumstances, a negative temperature coefficient of the electrical resistance, i.e., a resistance that decreases as temperature increases. In the past, this behavior has been theoretically predicted and experimentally observed, but only for a certain class of CNTs, with short lengths (up to some micrometers) and in a limited range of temperature. This paper demonstrates… CONTINUE READING

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