Model Based Test Generation for Microprocessor Architecture Validation

  title={Model Based Test Generation for Microprocessor Architecture Validation},
  author={Sreekumar V. Kodakara and Deepak Mathaikutty and Ajit Dingankar and Sandeep K. Shukla and David. J. Lilja},
  journal={20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07)},
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used in simulation based validation, like simulators and test generators, to validate the system, architecture, microcode, and RTL abstractions of the processor, were manually derived from the specification document. The incomplete informal specification document along with manual translation introduces inconsistency and… CONTINUE READING

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