Mixed Weibull distribution model of DC dielectric breakdowns with dual defect modes

  • Allen Andersen, J. R. Dennison
  • Published 2015 in
    2015 IEEE Conference on Electrical Insulation and…
This work provides physical insight into common statistical models for DC dielectric breakdown field strengths. Voltage step-up tests were performed on low density polyethylene films. The merits of generalizations to widely-used empirical Weibull models are discussed. The cumulative probability distributions of the breakdown fields were fit to standard two… (More)

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