Mitigating Radiation-Induced Charge Transfer Inefficiency in Full-Frame CCD Applications by ‘ Pumping ’ Traps

@inproceedings{Murray2012MitigatingRC,
  title={Mitigating Radiation-Induced Charge Transfer Inefficiency in Full-Frame CCD Applications by ‘ Pumping ’ Traps},
  author={Neil J. Murray and A. D. Hollanda and J. P. D. Gowa and D. J. Halla and J. H. Tutta and D. Burtb and J. Endicottb},
  year={2012}
}
The charge transfer efficiency of a CCD is based on the average level of signal lost per pixel over a number of transfers. This value can be used to directly compare the relative performances of different structures, increases in radiation damage or to quantify improvements in operating parameters. This number does not however give sufficient detail to mitigate for the actual signal loss/deference in either of the transfer directions that may be critical to measuring shapes to high accuracy… CONTINUE READING
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