Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester

  title={Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester},
  author={Mirko Scholz and S.-H. Chen and David Johnsson and Antonio Gallerano and Geert Hellings and Dimitri Linten and D. Lafonteese and Ann Concannon and Gerd Vandersteen and Masanori Sawada and Guido Groeseneken},
  journal={Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012},
Several ESD protection devices are evaluated on-wafer with an IEC61000-4-2 type of HMM tester and a 50 Ω HMM tester. No clear correlation between the two tester models has been obtained. The 50 Ω source impedance triggers different failure modes and even different failure causes. 


Publications citing this paper.
Showing 1-4 of 4 extracted citations


Publications referenced by this paper.
Showing 1-7 of 7 references

A contribution to the evaluation of HMM for IO design

  • M. Song
  • Proc. EOS/ESD Symposium,
  • 2011
1 Excerpt

CDM ESD Challenges for nLDMOS SCR Devices for High-Voltage Applications in Standard Low-Voltage CMOS Technology

  • A. Griffoni
  • Proc. IEDM,
  • 2010
1 Excerpt

Shibkov, “ESD Design for Analog Circuits

  • A. V. Vashchenko
  • 2010
1 Excerpt

Similar Papers

Loading similar papers…