Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester

@article{Scholz2012MiscorrelationBI,
  title={Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester},
  author={Mirko Scholz and S.-H. Chen and David Johnsson and Antonio Gallerano and Geert Hellings and Dimitri Linten and D. Lafonteese and Ann Concannon and Gerd Vandersteen and Masanori Sawada and Guido Groeseneken},
  journal={Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012},
  year={2012},
  pages={1-9}
}
Several ESD protection devices are evaluated on-wafer with an IEC61000-4-2 type of HMM tester and a 50 Ω HMM tester. No clear correlation between the two tester models has been obtained. The 50 Ω source impedance triggers different failure modes and even different failure causes. 

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