Minimization of life cycle costs through optimization of the validation program - a test sample size and warranty cost approach

@article{Kleyner2004MinimizationOL,
  title={Minimization of life cycle costs through optimization of the validation program - a test sample size and warranty cost approach},
  author={Andre Kleyner and Peter Sandborn and Jim Boyle},
  journal={Annual Symposium Reliability and Maintainability, 2004 - RAMS},
  year={2004},
  pages={553-558}
}
This paper presents a method for calculating desired reliability demonstration for a product validation process, based on life cycle cost minimization. The paper is written in the context of a high-volume production industry and has a specific application to automotive electronics. The proposed method suggests a way to optimize the target reliability based on minimization of the sum of validation cost and expected reliability-related warranty returns by analytically linking the product… CONTINUE READING