Minimal March tests for unlinked static faults in random access memories

  title={Minimal March tests for unlinked static faults in random access memories},
  author={Gurgen Harutunyan and Valery A. Vardanian and Yervant Zorian},
  journal={23rd IEEE VLSI Test Symposium (VTS'05)},
New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002). 
Highly Cited
This paper has 45 citations. REVIEW CITATIONS

From This Paper

Figures, tables, and topics from this paper.

Explore Further: Topics Discussed in This Paper


Publications citing this paper.
Showing 1-10 of 32 extracted citations

Detecting memory faults in the presence of bit line coupling in SRAM devices

2010 IEEE International Test Conference • 2010
View 8 Excerpts
Highly Influenced

Memory repair for high fault rates

2016 IEEE International Test Conference (ITC) • 2016
View 5 Excerpts
Highly Influenced

Transparent BIST for ECC-based memory repair

2013 IEEE 19th International On-Line Testing Symposium (IOLTS) • 2013
View 8 Excerpts
Highly Influenced

Efficient microcontroller system to test an SRAM chip using signature analysis

2017 13th International Computer Engineering Conference (ICENCO) • 2017
View 4 Excerpts
Highly Influenced

Extending fault periodicity table for testing external memory faults

2016 IEEE East-West Design & Test Symposium (EWDTS) • 2016
View 4 Excerpts

Similar Papers

Loading similar papers…