Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

Abstract

The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of Random Access Memories (RAM) with significant impact on defect-per-million (DPM) levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N… (More)
DOI: 10.1007/s10836-006-9504-8

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Cite this paper

@article{Harutunyan2007MinimalMT, title={Minimal March Tests for Detection of Dynamic Faults in Random Access Memories}, author={Gurgen Harutunyan and Valery A. Vardanian and Yervant Zorian}, journal={J. Electronic Testing}, year={2007}, volume={23}, pages={55-74} }