Microwave Multiport Measurements for the Digital World

@article{Ferrero2011MicrowaveMM,
  title={Microwave Multiport Measurements for the Digital World},
  author={Alessandro Ferrero and Valeria Teppati and Evan Fledell and Brett Grossman and T Ruttan},
  journal={IEEE Microwave Magazine},
  year={2011},
  volume={12},
  pages={61-73}
}
We have seen that the challenges with multiport measurements for new digital applications are far from being solved. The evolution of multiport VNA architecture to partial reflectometers means that measurement of coupling between interconnects is cheaper and faster than with full reflectometer systems. However, given the very high connection density in these applications, the error model must still be extended to evaluate leakage between ports. 

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References

Publications referenced by this paper.
Showing 1-10 of 50 references

Investigation of a method to improve vna calibration in planar dispersive media through adding an asymmetrical reciprocal device

J. B. Scott
IEEE Trans. Microwave Theory Tech., vol. MTT-53, pp. 3007–3013, Dec. 2005. • 2005
View 11 Excerpts
Highly Influenced

Robust SOLT and alternative calibrations for four-sampler vector network analyzers

J. Jargon, R. Marks, D. Rytting
IEEE Trans. Microwave Theory Tech., vol. MTT-47, pp. 2008–2013, Oct. 1999. • 2008
View 1 Excerpt

Calibration and error correction techniques for network analysis

D. Rytting
Proc. MTT-S Int. Microwave Symp.—Educational Course, June 2007. • 2007

Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method

IEEE Transactions on Instrumentation and Measurement • 2007
View 1 Excerpt

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