Microstructure of Thin Si-Sn Composite Films

@article{Neimash2013MicrostructureOT,
  title={Microstructure of Thin Si-Sn Composite Films},
  author={V. B. Neimash and V. M. Poroshin and A. Kabaldin and Volodymyr O. Yukhymchuk and P. E. Shepelyavyĭ and V. A. Makara and S. Yu. Larkin and Production Concern Nauka},
  journal={Ukrainian Journal of Physics},
  year={2013},
  volume={58},
  pages={865-865}
}
Microstructure investigations of thin Si-Sn alloy films were carried out, by using Auger and Raman spectroscopies, X-ray fluorescence analysis, and electron microscopy. The films were produced by the thermal-vacuum coevaporation of Si and Sn. The properties of films with the Sn content ranging from 1 to 5 wt.% are studied. A significant influence of the tin impurity on the formation of a film surface microrelief and nanocrystals in the amorphous matrix is found. The size of quasispherical… 

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