Microstructure and texture evolution in oxide films prepared by ion-beam assisted laser deposition

Abstract

Using Ion-Beam Assisted Laser Deposition (IBALD), biaxially oriented films of Yttria stabilized Zirconia were deposited on polycrystalline and amorphous substrates. The film texture in dependence of deposition parameters was examined with X-ray texture analysis. As deposited films were analyzed by transmission electron microscopy and atomic force microscopy… (More)

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Cite this paper

@article{Holzapfel1999MicrostructureAT, title={Microstructure and texture evolution in oxide films prepared by ion-beam assisted laser deposition}, author={B. M. Holzapfel and Vaughn Betz and Danielle Schlafer and H Bauer and L. Schultz}, journal={IEEE Transactions on Applied Superconductivity}, year={1999}, volume={9}, pages={1479-1482} }