Micro-and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation

@inproceedings{Berfield2006MicroandND,
  title={Micro-and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation},
  author={Thomas A. Berfield and Jay K. Patel and Robert Gene Shimmin and Paul V Braun and John Lambros and Nancy R. Sottos},
  year={2006}
}
The digital image correlation (DIC) technique is successfully applied across multiple length scales through the generation of a suitable speckle pattern at each size scale. For microscale measurements, a random speckle pattern of paint is created with a fine point airbrush. Nanoscale displacement resolution is achieved with a speckle pattern formed by… CONTINUE READING