[Methods of detector response function establishment in X-ray fluorescence spectra analysis].

Abstract

During the measurement and analysis process of X-ray fluorescence spectra, it is very helpful to improve the analyze speed, accuracy and automaticity of X-ray fluorescence spectra analysis by establishing detector response function(DRF), which represents the shape of full energy peak and can provide former basic data for subsequent X-ray analysis technique. For the theory and model of semiconductor DRF in X-ray energy spectrum measurements, methods of three typical detector response function model establishment, key parameters of full energy peak standard deviation and Fano factor calculation, etc. are discussed, and meanwhile, the summarization and contrast of existing studies are shown in this paper. Finally, the suggestion for modeling methods of DRF in X-ray fluorescence spectra measurements is provided.

Cite this paper

@article{Li2012MethodsOD, title={[Methods of detector response function establishment in X-ray fluorescence spectra analysis].}, author={Zhe Li and Xian-guo Tuo and Jianbo Yang and Ming-Zhe Liu and Yi Cheng and Lei Wang and Jian-Bin Zhou}, journal={Guang pu xue yu guang pu fen xi = Guang pu}, year={2012}, volume={32 11}, pages={3112-6} }