Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer.

@article{Coppola2003MethodFM,
  title={Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer.},
  author={Giuseppe Coppola and Pietro Ferraro and Mario Iodice and S De Nicola},
  journal={Applied optics},
  year={2003},
  volume={42 19},
  pages={3882-7}
}
A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed. The method is based on a simple, variable lateral-shear, wavelength-scanning interferometer. To achieve highly accurate measurements of both refractive index n and thickness d we use several means to determine these two quantities. We finely tune a distributed-feedback diode laser light source to introduce a phase shift into the detected signal, whereas we make the sample rotate… CONTINUE READING