• Computer Science
• Published 1972
• DOI:10.1109/PROC.1972.8628

Method for measuring diode junction parameters as a function of current density and temperature

@inproceedings{Howes1972MethodFM,
  title={Method for measuring diode junction parameters as a function of current density and temperature},
  author={Michael James Howes and Thos. G. Read},
  year={1972}
}

• Michael James Howes, Thos. G. Read

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A simple rapid and accurate method of determining the junction parameters m and I s in the I-V relationship I = I s [exp (eV/mkT) - 1] is described, which enables their dependence on current density and temperature to be examined.