Method for characterizing nanoscale wear of atomic force microscope tips.

@article{Liu2010MethodFC,
  title={Method for characterizing nanoscale wear of atomic force microscope tips.},
  author={Jingjing Liu and Jacob K Notbohm and Robert W. Carpick and Kevin T Turner},
  journal={ACS nano},
  year={2010},
  volume={4 7},
  pages={3763-72}
}
Atomic force microscopy (AFM) is a powerful tool for studying tribology (adhesion, friction, and lubrication) at the nanoscale and is emerging as a critical tool for nanomanufacturing. However, nanoscale wear is a key limitation of conventional AFM probes that are made of silicon and silicon nitride (SiNx). Here we present a method for systematically quantifying tip wear, which consists of sequential contact-mode AFM scans on ultrananocrystalline diamond surfaces with intermittent measurements… CONTINUE READING
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