Method for capacitive thickness measurement without contact.

@inproceedings{Konermann2008MethodFC,
  title={Method for capacitive thickness measurement without contact.},
  author={Stefan Konermann and Markus Stein},
  year={2008}
}
Method for capacitive contactless measuring the thickness of a flat material (10) located in the marginal area (32) of a capacitor (C1, C2), with simultaneous measurement of the width L of a separation (16) air between the flat material and the capacitor plates, characterized in that the capacities gL, kL of two capacitors (C1, C2), whose fringe fields (32) are attenuated with different rates towards the flat material (10) are measured, and that both the thickness D of the flat material (10… CONTINUE READING

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