Meta-QTL for resistance to white mold in common bean

  title={Meta-QTL for resistance to white mold in common bean},
  author={Renato C. C. Vasconcellos and O. Blessing Oraguzie and Alvaro J. Soler and Haidar Arkwazee and James R. Myers and Juan Jos{\'e} Ferreira and Qijian Song and Phil McClean and Phillip N. Miklas},
  booktitle={PloS one},
White mold, caused by the fungus Sclerotinia sclerotiorum (Lib.) de Bary, is a major disease that limits common bean production and quality worldwide. The host-pathogen interaction is complex, with partial resistance in the host inherited as a quantitative trait with low to moderate heritability. Our objective was to identify meta-QTL conditioning partial resistance to white mold from individual QTL identified across multiple populations and environments. The physical positions for 37… CONTINUE READING
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QTL mapping associated with morphological traits of bean seedlings and response to low temperature in germination

  • E Pérez-Vega, A Campa, S Mamidi, R Lee, Q Song, PE McClean
  • Annu Rep Bean Improv Coop
  • 2016

Registration of Common Bean Pinto PRP 153 and VCP 13 with High Levels of Broad - Spectrum White Mold Resistance

  • SP Singh, HF Schwartz, H Terán, C Centeno, K Otto
  • J Plant Regist
  • 2016

Use of multisite screening to identify and verify partial resistance to white mold in common bean in 2015

  • R Higgins, Steadman
  • Annu Rep Bean Improv Coop
  • 2016

Quantitative Trait Loci Analysis of White Mold Avoidance in Pinto Bean

  • V Hoyos-Villegas, W Mkwaila, PB Cregan, JD Kelly
  • Crop Sci
  • 2015

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