Membrane-Based Scanning Force Microscopy

@article{Hlg2020MembraneBasedSF,
  title={Membrane-Based Scanning Force Microscopy},
  author={David H{\"a}lg and T. Gisler and Y. Tsaturyan and Letizia Catalini and U. Grob and M. Krass and Martin H'eritier and H. Mattiat and A. Thamm and R. Schirhagl and E. Langman and A. Schliesser and C. Degen and A. Eichler},
  journal={arXiv: Applied Physics},
  year={2020}
}
We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest. We present first topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a… Expand

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