Medium-range order in amorphous silicon investigated by constrained structural relaxation of two-body and four-body electron diffraction data

@inproceedings{Borisenko2012MediumrangeOI,
  title={Medium-range order in amorphous silicon investigated by constrained structural relaxation of two-body and four-body electron diffraction data},
  author={Konstantin B. Borisenko and Bianca Haberl and Amelia Chi Ying Liu and Yixin Chen and Guoqiang Li and James Williams and J. E. Bradby and David J. H. Cockayne and Michael Treacy},
  year={2012}
}
Abstract The structures of four types of amorphous silicon are examined by an experimentally constrained structural relaxation method (ECSR). Experimental selected area electron diffraction data and fluctuation electron microscopy normalized diffraction variance data were used as constraints to guide a Monte Carlo relaxation procedure towards best fit models. A Tersoff potential was also used to further restrict the space of possible solutions. The materials examined were self-ion-implanted… CONTINUE READING