• Corpus ID: 236924675

Measuring photoexcited electron and hole dynamics in ZnTe and modeling excited state core-valence effects in transient XUV reflection spectroscopy

@inproceedings{Liu2021MeasuringPE,
  title={Measuring photoexcited electron and hole dynamics in ZnTe and modeling excited state core-valence effects in transient XUV reflection spectroscopy},
  author={Hanzhe Liu and Jonathan M. Michelsen and Isabel M. Klein and Scott K. Cushing},
  year={2021}
}
Abstract Transient XUV spectroscopy is growing in popularity for the measurement of solar fuel and photovoltaic materials as it can separately measure electron and hole energies for multiple elements at once. However, interpretation of transient XUV measurements is complicated by changes in core-valence exciton and angular momentum effects after photoexcitation. Here, we report the photoexcited electron and hole dynamics for ZnTe, a promising material for CO2 reduction, following 400 nm… 
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