Measuring and Improving Design Patterns Testability

@inproceedings{Baudry2003MeasuringAI,
  title={Measuring and Improving Design Patterns Testability},
  author={Benoit Baudry and Yves Le Traon and Gerson Suny{\'e} and Jean-Marc J{\'e}z{\'e}quel},
  booktitle={IEEE METRICS},
  year={2003}
}
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testability anti-patterns) of an OO design is a crucial task, one cannot expect from a non-specialist to make the right improvements, without guidance or automation. To overcome this limitation, this paper investigates solutions integrated to the 00 process. We focus on the design patterns as coherent subsets in the… CONTINUE READING
Highly Cited
This paper has 31 citations. REVIEW CITATIONS