Measurement of the near infrared absorption of Ge on Si films by differential spectroscopy

@article{Sorianello2008MeasurementOT,
  title={Measurement of the near infrared absorption of Ge on Si films by differential spectroscopy},
  author={Vito Sorianello and Angelo Perna and Lorenzo Colace and Gaetano Assanto and H. C. Luan and L. C. Kimerling},
  journal={2008 5th IEEE International Conference on Group IV Photonics},
  year={2008},
  pages={134-136}
}
Using a differential method on epitaxially grown Ge films on silicon, we measure the near-infrared absorption and its temperature dependence.