Measurement of potential dependent DNA orientation on Indium Tin Oxide surfaces by fluorescent-self interference microscopy


We present a platform for the measurement of DNA orientation on an Indium Tin Oxide surface. We apply an interferometric measurement technique called spectral self-interference fluorescent microscopy (SSFM) that allows precise distance measurements of fluorophores from the sensor surface. SSFM can be used to infer the orientation and conformation of bound… (More)


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