Measurement of low‐energy backscatter factors using GAFCHROMIC film and OSLDs

@inproceedings{Mart2012MeasurementOL,
  title={Measurement of low‐energy backscatter factors using GAFCHROMIC film and OSLDs},
  author={Chris J. Mart and Howard R. Elson and Michael A. S. Lamba},
  booktitle={Journal of applied clinical medical physics},
  year={2012}
}
Some of the lowest voltages used in radiotherapy are termed Grenz and superficial X-rays of ~ 20 and ~ 100 kVp, respectively. Dosimetrically, the surface doses from these beams are calculated with the use of a free in-air air kerma measurement combined with a backscatter factor and the appropriate ratio of mass energy absorption coefficients from the measurement material to water. Alternative tools to the standard ion chamber for measuring the BSF are GAFCHROMIC EBT2 film and optically… CONTINUE READING

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