Measurement of laterally induced optical forces at the nanoscale

@article{Huang2017MeasurementOL,
  title={Measurement of laterally induced optical forces at the nanoscale},
  author={Fei Huang and Venkata Ananth Tamma and H Kumar Wickramasinghe},
  journal={Applied Physics Letters},
  year={2017},
  volume={110},
  pages={063103}
}
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a single nano-aperture in a gold film is mapped by measuring the lateral optical force between the apex of the AFM probe and the nano-aperture. The fundamental torsional eigen-mode of an AFM cantilever probe was used to detect the laterally induced optical forces. We engineered the cantilever shape using focused… 

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