Measurement of contact surface photo-voltage from forward bias C-V characteristics of P3HT:PCBM based BHJ solar cells

@inproceedings{Verma2017MeasurementOC,
  title={Measurement of contact surface photo-voltage from forward bias C-V characteristics of P3HT:PCBM based BHJ solar cells},
  author={Upkar K. Verma and Surajit Kumar and Yogomaya Mohapatra},
  year={2017}
}
Abstract The surface photovoltage (SPV) and carrier accumulation in open circuit conditions are sensitive indicators of the contact quality and band bending. However, these are not accessible directly in experiments. We analyze the capacitance-voltage (C-V) characteristics in P3HT:PCBM based bulk heterojunction to investigate SPV for both conventional (transparent anode) and inverted (transparent cathode) architectures. The C-V characteristics under dark conditions are analyzed using drift… CONTINUE READING