Measurement of a cross-sectional profile of a thread gauge using a sinusoidally vibrating interference pattern.

Abstract

A sinusoidally vibrating interference pattern (SVIP) is used as an exact spatial scale in order to measure a cross-sectional profile of a thread gauge. The SVIP is projected on the thread gauge surface, and lights diffracted and reflected from the end points of the thread gauge surface are extracted by spatial frequency filtering in an imaging system to… (More)
DOI: 10.1364/AO.50.003470

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