Measurement, simulation and reduction of EOS damage by electrical fast transients on AC power

@article{Wallash2010MeasurementSA,
  title={Measurement, simulation and reduction of EOS damage by electrical fast transients on AC power},
  author={Al Wallash and Vladimir Kraz},
  journal={Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010},
  year={2010},
  pages={1-6}
}
It is shown that electrical fast transients (EFT) on the AC power line can result in electrical overstress (EOS) damage to a Class 0 ESD sensitive device connected to the output of AC powered equipment. A methodology for measuring EFT and EOS transients is described and simulations are used to understand coupling mechanisms. Finally, several techniques for reduction of the EOS transient are tested and analyzed. 
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