Corpus ID: 15185858

Maximum likelihood estimation of ADC parameters from sine wave test data

@inproceedings{Balogh2007MaximumLE,
  title={Maximum likelihood estimation of ADC parameters from sine wave test data},
  author={L. Balogh and B. Fodor and A. S{\'a}rhegyi and I. Koll{\'a}r},
  year={2007}
}

L. Balogh, B. Fodor, +1 author I. Kollár

Published 2007

Mathematics

The sine wave test is maybe the most important method for characterizing ADC’s. By this, the acquisition device is excited with a sinusoidal signal, and a long series of output values is measured. With the help of these observations, the parameters of the DUT can be determined. The general method to do this is the Least Squares (LS). In this paper, we present a similar method using the Maximum Likelihood Estimation (MLE). It is more robust than the LS method, which has nice properties only… CONTINUE READING

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