Mathematical Analysis of Logical Masking Capability of Logic Gates


In this paper, logical masking capability of commonly used logic gates such as NOT, AND/NAND, OR/NOR, and XOR/XNOR, when subject to single/multiple input faults, are analyzed from a mathematical perspective. A new metric, called Gate Error Metric (GEM) is proposed to study the extent of output error in these gates when subject to potential input fault… (More)


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