Materials analysis and particle probe: a compact diagnostic system for in situ analysis of plasma-facing components (invited).

@article{Taylor2012MaterialsAA,
  title={Materials analysis and particle probe: a compact diagnostic system for in situ analysis of plasma-facing components (invited).},
  author={C. N. Taylor and Bryan Heim and Sean Robert Gonderman and Jean Paul Allain and Zhaojun Yang and R Kaita and A. L. Roquemore and Charles H. Skinner and Robert Ellis},
  journal={The Review of scientific instruments},
  year={2012},
  volume={83 10},
  pages={10D703}
}
The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate… CONTINUE READING