• Corpus ID: 29603114

Material Identification Methods in Spectral Radiography Using CdTe Semiconductor Detectors

@inproceedings{Rebuffel2011MaterialIM,
  title={Material Identification Methods in Spectral Radiography Using CdTe Semiconductor Detectors},
  author={Veronique Rebuffel and Jean Rinkel and Guillaume Beldjoudi},
  year={2011}
}
Material identification in radiography is traditionally performed by dualenergy systems, using double exposure technique or two-layers detectors. Performance of such systems results from the closeness of the materials to be discriminated, from photonic noise, and energetic discriminating power of the detector. For difficult problems such as explosive detection in luggage, conventional dual-energy radiography provides only a crude material characterization. Recently emerged semiconductors based… 

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